General Microscope Accessories
Electron Microscopy Sciences Veco Square Center Reference 200 mesh Nickel Grid
Veco Grids offer superior handling characteristics. Plus, with a 0.8 mil thickness, Veco Grids are the most rigid grids available. 3.05 mm diameter.
Grid: Nickel
Pitch: 125 µm
Hole: 85 µm
Bar: 40 µm
Electron Microscopy Sciences Formvar Support Film 5-6 nm thick on 2 X 1 mm Slot Grid Copper Grid
A thin film of pure formvar resin coats the shiny side of a slotted grid. Coated grids are optically checked and batch tested in the electron microscope. Packed in grid storage box. Standard coating is 5 to 6 nm thick.
Grid: Copper
Electron Microscopy Sciences Calibration Specimen 750-HD, Unmounted
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. AFM, SEM, product: 750-HD, pattern: array of flat bumps, nominal pitch: 750 (x), Z (100), material: Ni.
Mount: Unmounted
Electron Microscopy Sciences Chalkley Point Array Graticle NG52, 16mm
Eyepiece graticle is used to quickly determine the relationship of components to each other using random sampling. Curtis gives an example of its application, where a researcher may want to see whether or not a certain drug affects the volume proportion of cell types in a given organ. With this graticule the proportion of points lying over the image of one type of component is statistically proportional to the area occupied by that component. The 25 points of the array are placed over the field of view at random, so that a comparison can be made between the number of points touching the one type of component, with number touching the other type of component in each viewing. A series of observations will yield an increasingly accurate ratio of the comparative incidence of each type of particle.
Size: 16 mm
MICRO OPTICS PRECISION INSTRUMENTS INC OBJECTIVE IPLAN-ACHROMAT 100X
NC3720930 OBJECTIVE IPLAN-ACHROMAT 100X
Electron Microscopy Sciences Thin Sample Holder, 8 mm Pin
Ideal for examination cross section of thin samples, such as wafers, multi-layer of capacitors, plastics, metals, etc. For most AMRAY: 1/2" diameter (12.7mm), 1/8" (3.1mm)dia. Pin (3.1mm) with split openings up to 1/4" (6.4mm), with 8mm (5/16") pin height
Ibidi USA µ-Slide Microscopy Rack
µ-Slide Microscopy rack is a aluminum rack made to hold 4 µ-Slides for analysis of multiple samples. The multiwell format is compatible with all inverted microscopes. Magnetic Lids sold seperately. aluminum, black, 127.5 x 85.5 x 12 mm
Electron Microscopy Sciences Porton Graticle NG2, 16mm
The circle areas of the Porton greaticules increases with Root 2 progression as do the divisions on the right hand side of the rectangle. These divisions are numbered for convenience. The rectangle size is 4.5 mm x .25 mm. Circle sizes in microns are 560, 400, 280, 200, 140, 100, 70, 50, and 35. The specimen is racked on the mechanical stage of the microscope and traverses are taken right across thee deposit sizing all the particles encountered.
Size: 16mm
Surface: Chrome image
Electron Microscopy Sciences Calibration Specimen 700-2D, Unmounted
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. 700-2D, pattern: array of posts, nominal pitch: 700 nm, material: W-coated photoresist on Si.
Mount: Unmounted
Electron Microscopy Sciences Calibration Specimen 300-2D, Unmounted
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. 300-2D, pattern: array of posts, nominal pitch: 300 nm, material: W-coated photoresist on Si.
Mount: Unmounted
Electron Microscopy Sciences BEEM Blocklock Storage Box for #69959
Specimen blocks are safely stored in Blocklock storage modules, a component in the BEEM Specimen Storage System 2000. All Blocklocks can be inserted in a Plastic Protective Box or, by utilizing the adhesive feature, mounted in combination with other Blocklock modules on the BEEM mounting panel that fits in a standard " D-Type" 3-ring binder. Heavy-duty, two tone plastic box supplied with indexed translucent labels for top or bottom of the box. Two-tone black/clear.
Morrell Instrument Company Inc EYEPIECE POINTER
Morrell is only authorized to sell the following products in New York, New Jersey, Pennsylvania, Maryland, Washington DC, Delaware, Virginia, West Virginia, Ohio, Indiana, and Kentucky.
Morrell Instrument Company Inc CFI APO LAMBDA D 2X/0.10/8.5MM
NC3849802 CFI APO LAMBDA D 2X/0.10/8.5MM
Morrell Instrument Company Inc CFI PLAN FLUOR 10X/0.30/16.00
NC3849804 CFI PLAN FLUOR 10X/0.30/16.00